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Technical Program
Paper Detail
| Paper: | TA-P4.11 |
| Session: | Denoising - I |
| Time: | Tuesday, October 10, 09:40 - 12:20 |
| Presentation: |
Poster
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| Title: |
SURE-BASED WAVELET THRESHOLDING INTEGRATING INTER-SCALE DEPENDENCIES |
| Authors: |
Florian Luisier; Ecole Polytechnique Fédérale de Lausanne (EPFL) | | | | | Thierry Blu; Ecole Polytechnique Fédérale de Lausanne (EPFL) | | | | | Michael Unser; Ecole Polytechnique Fédérale de Lausanne (EPFL) | | |
| Abstract: |
We propose here a new pointwise wavelet thresholding function that incorporates inter-scale dependencies. This non-linear function depends on a set of four linear parameters per subband which are set by minimizing Stein's unbiased MSE estimate (SURE). Our approach assumes additive Gaussian white noise. In order for the inter-scale dependencies to be faithfully taken into account, we also develop a rigorous feature alignment processing, that is adapted to arbitrary wavelet filters (e.g. non-symmetric filters). Finally, we demonstrate the efficiency of our denoising approach in simulations over a wide range of noise levels for a representative set of standard images. |
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